Main / Activities / Research papers
Journals
Saúl Montalván, Pablo Arcos, Pablo Sarzosa, Richard Alejandro, Rocha, Sang Guun Yoo(*), Youbean Kim, "Technologies and Solutions for Cattle Tracking: A Review of State-of-the-Art", Sensors, 2024
Minki Kim, Youbean Kim, Seungsu Chun, Miyoung Hong(*), "A Study on Emerging Technologies Analysis Methods Based on Patent Big Data", Journal of Knowledge Information Technology and Systems, (KCI), 2024.
Junhyeong Ji, Jonghee Park, Jiseok Lee, Hwarang Baek, and Youbean Kim(*), “FPGA-Based SPI Module System Implementation for Various DPS Evaluations in ATE”, Journal of Semiconductor Technology and Science(JSTS), 2024.
Keonyeong Jeong, Kyungmoo Heo, Youbean Kim(*), Exploring Alternative Futures focused on S&T Policy of Kim Jong-un's Regime, Pacific Focus, (SSCI), 2024.
Jeonghyeon Choi, Youbean Kim(*), Low Loss Hybrid-plane PCB Structure for Improving Signal Quality in High-speed Signal Transmission, IEEE Access, 2024.
Youbean Kim, Exploring Emerging Technologies with Analysis of Bibliographic Data Focused on Plasma Surface Treatment, Coatings, 2021.
Youbean Kim, Soyeon Park, Ki-Seok Kwon(*), Forecasting the Environmental Change of Technological Innovation System in South Korea in the COVID-19 Era, Asian Society for Innovation Policy, 2020.
Wonjae Choi, Hyunsoo Tho, Youbean Kim(*), Sungha Hwang, Dongyup Kang, The Economic Benefits of Big Science R&D: With a Focus on Fusion R&D Program in Korea, Fusion Engineering and Design, 2017.
Youbean Kim, Jaewon Jang, Hyunwook Son, Sungho Kang(*), Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method, IEICE Trans. INF.&SYST., 2010.
Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang(*), A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals, IEICE Trans. Electronics, 2008.
Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang(*), New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST, IEICE Trans. INF.&SYST., 2008.
Kicheol KIM, Youbean KIM, Incheol KIM, Hyeonuk SON, Sungho KANG, A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters, IEICE Trans. Electronics, 2008.
Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang, A New Analog-to-Digital Converter BIST Considering a Transient Zone, IEICE Trans. Electronics, 2007.
Conferences
구지민, 최정현, 김유빈(*), “딥러닝 기반 ATE 신호 전송 채널의 고장 부품 진단 연구”, 한국반도체테스트학술대회. 2025. (Domestic)
심혜은, 지준형, 김유빈(*), “ATE 리니어 가이드의 예지보전을 위한 진동 기반 AI 이상 탐지 적용 연구”, 한국반도체테스트학술대회. 2025. (Domestic)
이희찬, 김유빈(*), “가속 수명 시험을 통한 ATE 부품의 수명예측 연구”, 한국반도체테스트학술대회. 2025. (Domestic)
지준형, 김유빈(*), “3D IC를 위한 행·열 SCAN 방식 TSV 병렬 테스트 기법”, 한국반도체테스트학술대회. 2025. (Domestic)
최정현, 홍성범, 김유빈(*), “ATE 부품 열화에 따른 인공지능 기반 유지보수 효율화 방안 연구”, 한국반도체테스트학술대회. 2024. (Domestic)
Dongheun Ha, Mi-Young Hong, Jinsil Jo, Youbean Kim, Yeongjun Yeo, "Research on Emerging Issue Analysis from Korean R&D Investment Direction", IEEE Asia-Pacific Conference on Computer Science and Data Engineering (CSDE), 2023. (International)